Journal of Electronic Testing
Journal of Electronic Testing: Theory and Applications is a peer-reviewed scientific journal published bimonthly by Springer Science+Business Media. Established in 1990, it covers developments in electronics testing, including tests of VLSI devices and printed circuit boards, as well as fault modeling and analysis.[1] Its current editor-in-chief is Vishwani Agrawal (Auburn University).[2] Abstracting and indexingThe journal is abstracted and indexed in:
According to the Journal Citation Reports, the journal has a 2024 impact factor of 1.3.[6] References
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